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Derniers dépôts
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Jean-Max Dutertre, Amir Pasha Mirbaha, David Naccache, Anne-Lise Ribotta, Assia Tria, et al.. Fault Round Modification Analysis of the Advanced Encryption Standard. Hardware-Oriented Security and Trust (HOST), 2012, Jun 2012, San Francisco, United States. pp.140--145, ⟨10.1109/HST.2012.6224334⟩. ⟨emse-00742567⟩
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Roukoz Nabhan, Jean-Max Dutertre, Jean-Baptiste Rigaud, Jean-Luc Danger, Laurent Sauvage. EM Fault Injection-Induced Clock Glitches: From Mechanism Analysis to Novel Sensor Design. 30th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) (2024), Jul 2024, Rennes, France. ⟨10.1109/IOLTS60994.2024.10616074⟩. ⟨hal-04665887⟩
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Nicolas Borrel, Clément Champeix, Mathieu Lisart, Alexandre Sarafianos, Edith Kussener, et al.. Characterization and simulation of a body biased structure in triple-well technology under pulsed photoelectric laser stimulation. International Symposium for Testing and Failure Analysis (ISTFA), Nov 2014, Houston, United States. ⟨emse-01099035⟩
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Raphael Viera, Jean-Max Dutertre, Rodrigo Silva Lima, Matthieu Pommies, Anthony Bertrand. Tampering with the flash memory of microcontrollers: permanent fault injection via laser illumination during read operations. Journal of Cryptographic Engineering, 2023, 14 (2), pp.207 - 221. ⟨10.1007/s13389-023-00335-z⟩. ⟨hal-04667604⟩
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Paul Grandamme, Pierre-Antoine Tissot, Lilian Bossuet, Jean-Max Dutertre, Brice Colombier, et al.. Switching Off your Device Does Not Protect Against Fault Attacks. IACR Transactions on Cryptographic Hardware and Embedded Systems, 2024, 2024 (4), pp.425-450. ⟨10.46586/tches.v2024.i4.425-450⟩. ⟨hal-04642748⟩
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Mohammad Ebrahimabadi, Suhee Sanjana Mehjabin, Raphael Viera, Sylvain Guilley, Jean-Luc Danger, et al.. Delfines: Detecting Laser Fault Injection Attacks Via Digital Sensors. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2023, pp.1-1. ⟨10.1109/TCAD.2023.3322623⟩. ⟨hal-04260842⟩
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Raphael Andreoni Camponogara-Viera, Jean-Max Dutertre, Philippe Maurine, Rodrigo Possamai Bastos. Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale Circuits. ISPD 2018 - International Symposium on Physical Design, Mar 2018, Monterey, CA, United States. pp.160-167, ⟨10.1145/3177540.3178243⟩. ⟨lirmm-01743368⟩